{"id":73,"date":"2022-02-08T16:41:31","date_gmt":"2022-02-08T15:41:31","guid":{"rendered":"https:\/\/project.inria.fr\/fasy\/?page_id=73"},"modified":"2025-10-30T16:10:45","modified_gmt":"2025-10-30T15:10:45","slug":"publications","status":"publish","type":"page","link":"https:\/\/project.inria.fr\/fasy\/publications\/","title":{"rendered":"Publications"},"content":{"rendered":"<h5>International Conferences<\/h5>\n<ul>\n<li>A. Kritikakou, P. Nikolaou, I. Rodriguez-Ferrandez, J. Paturel, L. Kosmidis, M.K. Michael, O. Sentieys, D. Steenari, \u201cFunctional and Timing Implications of Transient Faults in Critical Systems\u201d, IEEE International Symposium on On Line Testing and Robust System Design (IOLTS), 2022<\/li>\n<li>F.F. dos Santos, A. Kritikakou, and O. Sentieys, \u201cExperimental evaluation of neutron-induced errors on a multicore RISC-V platform\u201d, IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), 2022<\/li>\n<li>Pegdwende Romaric Nikiema, Alessandro Palumbo, Allan Aasma, Luca Cassano, Angeliki Kritikakou, Ari Kulmala, Jari Lukkarila, Marco Ottavi, Rafail Psiakis, and Marcello Traiola, &#8220;<a href=\"https:\/\/hal.archives-ouvertes.fr\/hal-04397384\">Towards Dependable RISC-V Cores for Edge Computing Devices<\/a>&#8220;, IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), 2023<\/li>\n<li>Pegdwende Romaric Nikiema, Angeliki Kritikakou, Marcello Traiola, and Olivier Sentieys, &#8220;<a href=\"https:\/\/hal.archives-ouvertes.fr\/hal-04397673v1\">Design with low complexity fine-grained Dual Core Lock-Step (DCLS) RISC-V processors<\/a>&#8220;, IEEE\/IFIP International Conference on Dependable Systems and Networks &#8211; Supplemental Volume (DSN-S), 2023<\/li>\n<li>Pegdwende Romaric Nikiema, Angeliki Kritikakou, Marcello Traiola, and Olivier Sentieys, &#8220;<a href=\"https:\/\/drops.dagstuhl.de\/entities\/document\/10.4230\/LIPIcs.ECRTS.2023.15\">Impact of transient faults on timing behavior and mitigation with near-zero WCET overhead<\/a>&#8220;, Euromicro Conference on Real-Time Systems (ECRTS), 2023<\/li>\n<li>Pegdwende Romaric Nikiema, Marcello Traiola, and Angeliki Kritikakou, &#8220;<a href=\"https:\/\/hal.archives-ouvertes.fr\/hal-04731794\">Special Session: Impact of Compiler Optimizations on the Reliability of a RISC-V-based Core<\/a>&#8220;, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2024<\/li>\n<li>Pegdwende Romaric Nikiema, Marcello Traiola, and Angeliki Kritikakou, &#8220;<a href=\"https:\/\/hal.archives-ouvertes.fr\/hal-04731794\">Special Session: Impact of Compiler Optimizations on the Reliability of a RISC-V-based Core<\/a>&#8220;, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2024.<\/li>\n<\/ul>\n<h5>Workshop<\/h5>\n<ul>\n<li>Pegdwende Romaric Nikiema, Angeliki Kritikakou, Marcello Traiola, and Olivier Sentiey, &#8220;<a href=\"https:\/\/selse.org\/\">Design with low complexity fine-grained Dual Core Lock-Step (DCLS) RISC-V processors<\/a>&#8220;, IEEE Workshop on Silicon Errors in Logic \u2013 System Effects (SELSE), 2023. Note: Best paper award, included in the proceedings of the IEEE\/IFIP International Conference on Dependable Systems and Networks (DSN) 2023.<\/li>\n<\/ul>\n<h5>Posters<\/h5>\n<ul>\n<li>F.F. dos Santos, A. Kritikakou, and O. Sentieys, \u201c<a href=\"https:\/\/open-src-soc.org\/2022-05\/media\/posters\/4th-RISC-V-Meeting-2022-05-03-Fernando-FernandesdosSantos-poster.pdf\" target=\"_blank\" rel=\"noopener\">Experimental Evaluation of Neutron Induced Errors on a RISC V Processor<\/a>\u201d, Spring RISC-V week, 2022<\/li>\n<li>Angeliki Kritikakou, Pegdwende Romaric Nikiema, Marcello Traiola, and Olivier Sentieys, &#8220;Time-Bounded Error Mitigation through Dual-Core Lockstep RISC-V using HLS&#8221;, RISC-V Summit Europe, 2023<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>International Conferences A. Kritikakou, P. Nikolaou, I. Rodriguez-Ferrandez, J. Paturel, L. Kosmidis, M.K. Michael, O. Sentieys, D. Steenari, \u201cFunctional and Timing Implications of Transient Faults in Critical Systems\u201d, IEEE International Symposium on On Line Testing and Robust System Design (IOLTS), 2022 F.F. dos Santos, A. Kritikakou, and O. Sentieys, \u201cExperimental\u2026<\/p>\n<p> <a class=\"continue-reading-link\" href=\"https:\/\/project.inria.fr\/fasy\/publications\/\"><span>Continue reading<\/span><i class=\"crycon-right-dir\"><\/i><\/a> <\/p>\n","protected":false},"author":1912,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-73","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/project.inria.fr\/fasy\/wp-json\/wp\/v2\/pages\/73","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/project.inria.fr\/fasy\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/project.inria.fr\/fasy\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/project.inria.fr\/fasy\/wp-json\/wp\/v2\/users\/1912"}],"replies":[{"embeddable":true,"href":"https:\/\/project.inria.fr\/fasy\/wp-json\/wp\/v2\/comments?post=73"}],"version-history":[{"count":6,"href":"https:\/\/project.inria.fr\/fasy\/wp-json\/wp\/v2\/pages\/73\/revisions"}],"predecessor-version":[{"id":104,"href":"https:\/\/project.inria.fr\/fasy\/wp-json\/wp\/v2\/pages\/73\/revisions\/104"}],"wp:attachment":[{"href":"https:\/\/project.inria.fr\/fasy\/wp-json\/wp\/v2\/media?parent=73"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}