Chemical engineering

The possibility of using platinum foils with a rippled surface as diffraction gratings
V. E. Korsukov, A. V. Ankudinov, P. N. Butenko, S. A. Knyazev, M. M. Korsukova, B. A. Obidov, I. P. Shcherbakov
Technical Physics Letters, September 2014, Volume 40, Issue 9, pp 776-778

Corrosion Behavior of Ti-6Al-4V Alloys
C.G. Nava-Dino, C. López-Meléndez, R. G. Bautista-Margulis, M. A. Neri-Flores, J.G. Chacón-Nava, S.D de la Torre, J.G. Gonzalez-Rodriguez and A. Martínez-Villafañe
Int. J. Electrochem. Sci., 7 (2012) 2389 – 2402.
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Multifractal modelling of electrochemical noise in corrosion of carbon steel
S.V. Muniandya, W.X. Chewa, C.S. Kan
Corrosion Science, Volume 53, Issue 1, January 2011, Pages 188-200
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Ionic liquids: Determination of their aqueous content using differential scanning calorimeter equipment, chaotic parameters and a radial basis network model
José S. Torrecilla, Ester Rojo, Juan C. Domínguez, Francisco Rodríguez
Talanta, Volume 81, Issues 4-5, 15 June 2010, Pages 1766-1771

Chaotic parameters and their role in quantifying noise in the output signals from UV, TGA and DSC apparatus
José S. Torrecilla, Ester Rojo, Juan C. Domínguez, Francisco Rodríguez
Talanta, vol. 79, pp 665-668, 2009.
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Large deviation spectra of chaotic time series from Bray-Liebhafsky reaction
A.Z. Ivanovic, Z.D. Cupic, Lj.Z. Kolar-Anic, M.M. Jankovic, S.R. Ani
Russian Journal of Physical Chemistry A, Focus on Chemistry, vol. 83(9), pp 1526-1530, 2009.
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Fractal description of dendrite growing during electrochemical migration
Csaba Dominkovics, István Hajdu, Gábor Harsányi
ISSE, pp. 192-196, 2007.
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Heat treatment parameters effecting the fractal dimensions of AuGe metallization on GaAs
Imre Mojzes, Csaba Dominkovics, Gábor Harsányi, Szilvia Nagy, János Pipek, László Dobos
Applied physics letters, vol. 91(7), 2007.
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A simple discrete stochastic model for laser-induced jet-chemical etching
Alejandro Mora, Thomas Rabbow, Bernd Lehle, Peter J. Plath, Maria Haase
Fractals in Engineering, pp 125-139, 2004.
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Corrosion signal processing using wavelet analysis and Nyquist diagrams
Alexander M. Lowe, Halit Eren
IEEE Instrumentation and Measurement Technology Conference, pp 855-860, 2002.
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